A one-class Classification method based on depth statistics : applications to process analytical technology (PAT) and detection of counterfeited drugs

Avohou, Tonakpon Hermane; Sacre, Pierre-Yves; Hubert, Philippe; Ziemons, Eric

Scientific conference in universities or research centers (Scientific conferences in universities or research centers)

Avohou, Tonakpon Hermane; Sacre, Pierre-Yves; Hubert, Philippe et al.

2020

Permalink
https://hdl.handle.net/2268/264206

Files (1)Send to Details Statistics Bibliography Similar publications

Files

Full Text

Avohou_CIRMPresentation_AH_Final-3.pdf

Publisher postprint (2.2 MB)

Request a copy

All documents in ORBi are protected by a user license.

Send to

RIS BibTex APA Chicago Permalink X Linkedin

Details

Disciplines :

Pharmacy, pharmacology & toxicology

Author, co-author :

Avohou, Tonakpon Hermane ; Université de Liège - ULiège > Département de pharmacie > Chimie analytique

Sacre, Pierre-Yves ; Université de Liège - ULiège > Département de pharmacie > Chimie analytique

Hubert, Philippe ; Université de Liège - ULiège > Département de pharmacie > Chimie analytique

Ziemons, Eric ; Université de Liège - ULiège > Département de pharmacie > Chimie analytique

Language :

English

Title :

A one-class Classification method based on depth statistics : applications to process analytical technology (PAT) and detection of counterfeited drugs

Publication date :

18 February 2020

Event name :

Weekly CIRM Scientific Seminar

Event organizer :

CIRM, ULiege

Event place :

Liege, Belgium

Event date :

18 February 2020

Available on ORBi :

since 12 October 2021

Statistics

Number of views

62 (5 by ULiège)

Number of downloads

1 (0 by ULiège)

More statistics