Reference : Intragrain pinning strength depth dependence of 2223-(Bi,Pb)-based high critical Tc c...
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Intragrain pinning strength depth dependence of 2223-(Bi,Pb)-based high critical Tc ceramics made by a vitreous route
Dang, An [ > > ]
Godelaine, P. A. [ > > ]
Vanderbemden, Philippe mailto [Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Capteurs et systèmes de mesures électriques >]
Cloots, Rudi [Université de Liège - ULiège > Département de chimie (sciences) > Chimie inorganique structurale - Doyen de la Faculté des Sciences >]
Ausloos, Marcel [Université de Liège - ULiège > Département de physique > Physique statistique appliquée et des matériaux - S.U.P.R.A.S. >]
Journal of Applied Physics
American Institute of Physics
Yes (verified by ORBi)
[en] flux profile ; high-Tc superconductors ; critical current
[en] Campbell's method for measuring the critical current in superconductors has been used to obtain the critical current density and the pinning strength in Bi1.7Pb0.3Sr2Ca2Cu3O10−y ceramics synthesized by a vitreous route. The intragrain critical current is much higher than 10^5 A/cm2 at 40 K in zero dc magnetic field. A large increase of the pinning strength is observed near the grain surface. The decrease with depth is hyperbolic. The role of the precursors in the synthesis route is emphasized for introducing specific pinning centers. The analysis takes into consideration the ceramics granular nature, i.e., the existence of intergrain and intragrain currents. ©1995 American Institute of Physics.
Services Universitaires Pour la Recherche et les Applications Technologiques de Matériaux Électro-Céramiques, Composites, Supraconducteurs - SUPRATECS
Fonds de la Recherche Scientifique (Communauté française de Belgique) - F.R.S.-FNRS ; Services Fédéraux des Affaires Scientifiques, Techniques et Culturelles - SSTC
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Copyright (1995) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
The following article appeared in J. Appl. Phys. 77, 3560 (1995) and may be found at

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