[en] Particle induced X-ray emission (PIXE) method is used in the field of archeometry and specially to investigate pigment colored multilayers. The tilting of the sample with respect to the incident proton beam direction allows to modify the relative contribution of each layer to the fluorescence signal. The experimental results coupled to computer simulations lead to semi-quantitative information about the thickness, the position and the composition of the successive layers. (C) 1998 Elsevier Science B.V.
Weber, Georges ; Université de Liège - ULiège > Centre européen en archéométrie - Physique nucléaire, atomique et spectroscopie
Delbrouck, J. M.
Strivay, David ; Université de Liège - ULiège > Département de physique > Physique nucléaire, atomique et spectroscopie - Centre européen en archéométrie
Kerff, Frédéric ; Université de Liège - ULiège > Centre d'ingénierie des protéines
Martinot, Lucien ; Université de Liège - ULiège > Département de chimie (sciences) > Radiochimie
Language :
English
Title :
Use of a variable incidence angle PIXE arrangement for studying pigment multilayers
Publication date :
1998
Journal title :
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
