Reference : Use of a variable incidence angle PIXE arrangement for studying pigment multilayers
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Multidisciplinary, general & others
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/76710
Use of a variable incidence angle PIXE arrangement for studying pigment multilayers
English
Weber, Georges [Université de Liège - ULiège > > Centre européen en archéométrie - Physique nucléaire, atomique et spectroscopie >]
Delbrouck, J. M. [> > > >]
Strivay, David mailto [Université de Liège - ULiège > Département de physique > Physique nucléaire, atomique et spectroscopie - Centre européen en archéométrie >]
Kerff, Frédéric [Université de Liège - ULiège > > Centre d'ingénierie des protéines >]
Martinot, Lucien [> > > >]
1998
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Elsevier Science
139
1-4
196-201
Yes (verified by ORBi)
International
0168-583X
Amsterdam
The Netherlands
[en] Particle induced X-ray emission (PIXE) method is used in the field of archeometry and specially to investigate pigment colored multilayers. The tilting of the sample with respect to the incident proton beam direction allows to modify the relative contribution of each layer to the fluorescence signal. The experimental results coupled to computer simulations lead to semi-quantitative information about the thickness, the position and the composition of the successive layers. (C) 1998 Elsevier Science B.V.
http://hdl.handle.net/2268/76710
10.1016/S0168-583X(97)00971-3

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