Paper published in a book (Scientific congresses and symposiums)
Deep drawing simulations with different polycrystalline models
Duchene, Laurent; de Montleau, P.; Bouvier, S. et al.
2004In Gosh, Somnath; Castro, Jose M.; Lee, June K. (Eds.) Materials Processing and Design: Modeling, Simulation and Applications (NUMIFORM 2004)
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Keywords :
LIMARC
Abstract :
[en] The goal of this research is to study the anisotropic material behavior during forming processes, represented by both complex yield loci and kinematic-isotropic hardening models. A first part of this paper describes the main concepts of the ‘Stress-strain interpolation’ model that has been implemented in the non-linear finite element code Lagamine. This model consists of a local description of the yield locus based on the texture of the material through the full constraints Taylor’s model. The texture evolution due to plastic deformations is computed throughout the FEM simulations. This ‘local yield locus’ approach was initially linked to the classical isotropic Swift hardening law. Recently, a more complex hardening model was implemented: the physically-based microstructural model of Teodosiu. It takes into account intergranular heterogeneity due to the evolution of dislocation structures, that affects isotropic and kinematic hardening. The influence of the hardening model is compared to the influence of the texture evolution thanks to deep drawing simulations.
Disciplines :
Civil engineering
Author, co-author :
Duchene, Laurent  ;  Université de Liège - ULiège > Département Argenco : Secteur MS2F > Département Argenco : Secteur MS2F
de Montleau, P.
Bouvier, S.
Habraken, Anne  ;  Université de Liège - ULiège > Département ArGEnCo > Département ArGEnCo
Language :
English
Title :
Deep drawing simulations with different polycrystalline models
Publication date :
2004
Event name :
NUMIFORM 2004
Event date :
du 13 au 17 juin 2004
Audience :
International
Main work title :
Materials Processing and Design: Modeling, Simulation and Applications (NUMIFORM 2004)
Editor :
Gosh, Somnath
Castro, Jose M.
Lee, June K.
Publisher :
American Institute of Physics AIP Conference Proceedings
ISBN/EAN :
0-7354-0189-6
Pages :
588-593
Peer reviewed :
Peer reviewed
Available on ORBi :
since 31 August 2009

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