Article (Scientific journals)
A general parametric Stein characterization
Ley, Christophe; Swan, Yvik
2016In Statistics and Probability Letters, 111, p. 67-71
Peer Reviewed verified by ORBi
 

Files


Full Text
LSSPL15-rev.pdf
Author preprint (234.53 kB)
Download

All documents in ORBi are protected by a user license.

Send to



Details



Disciplines :
Mathematics
Author, co-author :
Ley, Christophe
Swan, Yvik ;  Université de Liège > Département de mathématique > Probabilités et statistique mathématique
Language :
English
Title :
A general parametric Stein characterization
Publication date :
2016
Journal title :
Statistics and Probability Letters
ISSN :
0167-7152
Publisher :
Elsevier Science, Amsterdam, Netherlands
Volume :
111
Pages :
67-71
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 14 January 2016

Statistics


Number of views
91 (4 by ULiège)
Number of downloads
241 (3 by ULiège)

Scopus citations®
 
2
Scopus citations®
without self-citations
0
OpenCitations
 
2

Bibliography


Similar publications



Contact ORBi