Reference : Detection of near-field, low permittivity layers with Ground Penetrating Radar: analy...
Scientific congresses and symposiums : Paper published in a book
Engineering, computing & technology : Civil engineering
http://hdl.handle.net/2268/168093
Detection of near-field, low permittivity layers with Ground Penetrating Radar: analytical estimation of the reflection coefficient
English
Van der Wielen, Audrey mailto [Belgian Road Research Center > > > >]
Courard, Luc mailto [Université de Liège - ULiège > Département ArGEnCo > Matériaux de construction non métalliques du génie civil >]
Nguyen, Frédéric mailto [Université de Liège - ULiège > Département ArGEnCo > Géophysique appliquée >]
2014
Proceedings of 15th International Conference on ground Penetrating Radar
LAMBOT, Sébastien
Yes
No
International
15th International Conference on ground Penetrating Radar - GPR 2014
30 June - 4 July 2014
UCL - TU Delft - The University of Edimburgh - Universita degli studi ROMA III
Bruxelles
Belgium
[en] GPR ; thin layers ; lateral wave ; spherical reflection ; plane wave approximation ; evanescent wave
[en] The reflection coefficient of GPR waves encountering embedded thin layers is commonly estimated using a plane wave, far field approximation. But when the thin layer is situated in the near field of the antenna, the spherical nature of the waves and the possible propagation of a lateral wave into the layer may have a strong influence on the measured reflected amplitude. In this work, we studied through 2D FDTD simulations the behavior of a radar wave interacting with thin layers of different thicknesses. The snapshots and radargrams showed a large influence of the layer thickness on the wave propagation. For the very thin layers, the evanescent wave plays a major role and the plane wave approximation gives a good estimation of the reflection coefficient. For thicker layers, the specific inclination of each multiple reflection has to be taken into account, as well as the lateral wave propagation. On the basis of these observations, we determined which analytical method should be used for the analytical prediction of the reflection coefficient, as a function of the layer thickness.
Fonds de la Recherche Scientifique (Communauté française de Belgique) - F.R.S.-FNRS/Université de Liège
Researchers
http://hdl.handle.net/2268/168093

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