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Nguyen, F., Garambois, S., Jongmans, D., Pirard, E., & Loke, M. H. (2005). Image processing of 2D resistivity data for imaging faults. Journal of Applied Geophysics, 57 (4), 260-277. doi:10.1016/j.jappgeo.2005.02.001 https://hdl.handle.net/2268/458