Unpublished conference/Abstract (Scientific congresses and symposiums)
Sequential Adaptive tailored Testing and Confidence Marking
Leclercq, Dieudonné
19773rd International Symposium on Educational Testing
 

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Keywords :
tailored testing; adaptive testing; confidence degrees; scoring rules; pay-off matrixes; subjective probabilities; educational testing; branching rule; starting rule; wits; rasch model; exponential logistic function
Abstract :
[en] Starting from the rasch model, the author explains how to take advantage in Confidence degrees given by the testee to concezive the starting rules, the branching rules and the stopping rules of an adaptive tailored testing. Note : These co,nsiderations have been deepened in a more recent publication : Leclercq (1982) "Confidence Marking. Its use in testing".
Disciplines :
Education & instruction
Author, co-author :
Leclercq, Dieudonné  ;  Université de Liège - ULiège > Département d'éducation et formation > Département d'éducation et formation
Language :
English
Title :
Sequential Adaptive tailored Testing and Confidence Marking
Publication date :
1977
Number of pages :
10
Event name :
3rd International Symposium on Educational Testing
Event organizer :
Educational testing Service (ETS) and University of Leyden
Event place :
Leyden, Netherlands
Event date :
27-29 juin 1977
Audience :
International
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since 18 June 2011

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