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On-Line Voltage Security Assessment of the Hellenic Interconnected System
Vournas, Costas; Manos, George; Kabouris, John et al.
2003In Proc. IEEE Bologna Power Tech conference
Peer reviewed
 

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Keywords :
Voltage Stability; Voltage Security Assessment; Quasi steady-state simulation; Secure Operation Limits; Loadability limits
Abstract :
[en] This paper describes the on-line Voltage Security Assessment environment developed within the framework of the EU-sponsored OMASES project, as well as its application to the Greek Interconnected Power System. The heart of all computations is a fast time-domain method. Security is analyzed with respect to power transfers in critical corridors or power consumption in load areas. Results take on the form of either precontingency secure operation limits, or post-contingency loadability limits, together with various diagnosis tips. Typical results obtained during the test phase of the project are reported.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Vournas, Costas
Manos, George
Kabouris, John
Christoforidis, George
Hassé, Gaëtan
Van Cutsem, Thierry  ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes et modélisation
Language :
English
Title :
On-Line Voltage Security Assessment of the Hellenic Interconnected System
Publication date :
26 June 2003
Event name :
2003 IEEE Bologna Power Tech conference
Event organizer :
University of Bologna
Event place :
Bologna, Italy
Event date :
du 23 juin 2003 au 26 juin 2006
Audience :
International
Main work title :
Proc. IEEE Bologna Power Tech conference
ISBN/EAN :
0-7803-7968-3
Pages :
paper No. 465
Peer reviewed :
Peer reviewed
Funders :
UE - Union Européenne [BE]
F.R.S.-FNRS - Fonds de la Recherche Scientifique [BE]
Commentary :
(c)2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
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