Abstract :
[en] Recent studies have shown that the T 2 control chart with variable sampling
intervals (VSI) and/or variable sample sizes (VSS) detects process shitis faster
than the traditional T 2 chart. This article extends these studies for processes that
are monitored with VSI and VSS using double warning lines ( T 2 - DWL ). It is
assumed that the length of time the process remains in control has exponential
distribution. The properties of T 2- DWL chart are obtained using Markov
chains. The results show that the T 2 - DWL chart is quicker than VSI and/or
VSS charts in detecting almost all shifts in the process mean.
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