Short note: Synthetic ilmenite as a blank to XRF trace element determination

Duchesne, Jean-Clair; Bologne, Guy

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Short note: Synthetic ilmenite as a blank to XRF trace element determination

Duchesne, Jean-Clair; Bologne, Guy

2011 • In Geologica Belgica, 14 (1-2), p. 103-106

Peer Reviewed verified by ORBi

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https://hdl.handle.net/2268/88037

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Keywords :

ilmenite; Vanadium; Chromium; evacuated silica-glass tube; XRF trace element analysis

Disciplines :

Earth sciences & physical geography

Author, co-author :

Duchesne, Jean-Clair ; Université de Liège - ULiège > Géologie > Pétrologie et Géochimie endogènes

Bologne, Guy

Language :

English

Title :

Short note: Synthetic ilmenite as a blank to XRF trace element determination

Publication date :

2011

Journal title :

Geologica Belgica

ISSN :

1374-8505

eISSN :

2034-1954

Publisher :

Geologica Belgica, Bruxelles, Belgium

Volume :

Issue :

1-2

Pages :

103-106

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 31 March 2011

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