Defect growth in model panel paintings by full field interferometry

Kouloumpi, E.; Moutsatsou, A.; Torres, L.; Tsaroucha, C.; Doulgeridis, M.; Bernikola, E.; Georges, Marc; Tornari, V.

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Defect growth in model panel paintings by full field interferometry

Kouloumpi, E.; Moutsatsou, A.; Torres, L. et al.

2008 • 8th European Commission Conference on Sustaining Europe's Cultural Heritage

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https://hdl.handle.net/2268/78227

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Disciplines :

Physics

Author, co-author :

Kouloumpi, E.

Moutsatsou, A.

Torres, L.

Tsaroucha, C.

Doulgeridis, M.

Bernikola, E.

Georges, Marc ; Université de Liège - ULiège > CSL (Centre Spatial de Liège)

Tornari, V.

Language :

French

Title :

Defect growth in model panel paintings by full field interferometry

Publication date :

November 2008

Event name :

8th European Commission Conference on Sustaining Europe's Cultural Heritage

Event organizer :

European Commission

Event place :

Lubjana, Slovenia

Event date :

10-12 November 2008

Audience :

International

Name of the research project :

MULTIENCODE

Funders :

UE - Union Européenne

Available on ORBi :

since 30 November 2010

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