Reference : Defect growth in model panel paintings by full field interferometry
Scientific congresses and symposiums : Unpublished conference/Abstract
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/78227
Defect growth in model panel paintings by full field interferometry
French
Kouloumpi, E. [ > > ]
Moutsatsou, A. [ > > ]
Torres, L. [ > > ]
Tsaroucha, C. [ > > ]
Doulgeridis, M. [ > > ]
Bernikola, E. [ > > ]
Georges, Marc mailto [Université de Liège - ULiège > > CSL (Centre Spatial de Liège) >]
Tornari, V. [ > > ]
Nov-2008
No
No
International
8th European Commission Conference on Sustaining Europe's Cultural Heritage
10-12 November 2008
European Commission
Lubjana
Slovenia
Union Européenne = European Union - UE = EU
MULTIENCODE
Researchers ; Professionals ; Students ; General public
http://hdl.handle.net/2268/78227

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