Article (Scientific journals)
Use of the alpha parameter method to calculate matrix corrections for infinitely thick targets (TTPIXE) with two different incident beam energies
Delbrouck Habaru, J.; Roelandts, I.; Strivay, David et al.
1997In Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms, 129 (1), p. 92-100
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Keywords :
pixe measurements; samples
Abstract :
[en] The alpha parameter correction method for calculating matrix effects in PIXE data does not require a priori knowledge of the major element composition of the matrix but implies the determination of a so-called alpha parameter linking two independent phenomena: X-ray absorption and proton energy loss. The method extrapolated to the infinitely thick targets (TTPIXE) has been previously studied using two PIXE measurements in two different geometric configurations. The present Study deals with the possibility of using pairs of PIXE measurements at two different energies to obtain the alpha corresponding to thick samples (TTPIXE). The experimental conditions and error minimization problems are discussed. General tables allowing an easy use of the method are presented.
Disciplines :
Physics
Author, co-author :
Delbrouck Habaru, J.
Roelandts, I.
Strivay, David  ;  Université de Liège - ULiège > Département de physique > Physique nucléaire, atomique et spectroscopie - Centre européen en archéométrie
Weber, Georges;  Université de Liège - ULiège > Physique
Language :
English
Title :
Use of the alpha parameter method to calculate matrix corrections for infinitely thick targets (TTPIXE) with two different incident beam energies
Publication date :
1997
Journal title :
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
ISSN :
0168-583X
eISSN :
1872-9584
Publisher :
Elsevier Science, Amsterdam, Netherlands
Volume :
129
Issue :
1
Pages :
92-100
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 23 November 2010

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