Electrical characterization of III-nitride heterostructures by thermal admittance spectroscopy

Doctoral thesis (Dissertations and theses)

Nguyen, Ngoc Duy

2004

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Nguyen_Ngoc_Duy_PhD_Thesis.pdf

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Keywords :

Electrical characterization; Nitride semiconductors; Admittance spectroscopy

Disciplines :

Physics

Author, co-author :

Nguyen, Ngoc Duy ; Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures

Language :

English

Title :

Electrical characterization of III-nitride heterostructures by thermal admittance spectroscopy

Defense date :

2004

Institution :

ULiège - Université de Liège

Degree :

Doctorat en sciences appliquées

Available on ORBi :

since 11 August 2010

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208 (43 by ULiège)

Number of downloads

13 (12 by ULiège)