Reference : Electrical characterization of III-nitride heterostructures by thermal admittance spe...
Dissertations and theses : Doctoral thesis
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/68382
Electrical characterization of III-nitride heterostructures by thermal admittance spectroscopy
English
Nguyen, Ngoc Duy mailto [Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures >]
2004
Université de Liège, ​​Belgium
Doctorat en sciences appliquées
[en] Electrical characterization ; Nitride semiconductors ; Admittance spectroscopy
Researchers ; Professionals
http://hdl.handle.net/2268/68382

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