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Article (Scientific journals)
The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices
Girones, Vincent; Boch, Jérôme; Carapelle, Alain et al.
2023 • In IEEE Transactions on Nuclear Science, p. 1-1
Peer Reviewed verified by ORBi
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https://hdl.handle.net/2268/303324
DOI
10.1109/tns.2023.3279626
 

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Keywords :
Electrical and Electronic Engineering; Nuclear Energy and Engineering; Nuclear and High Energy Physics
Disciplines :
Physics
Electrical & electronics engineering
Author, co-author :
Girones, Vincent ;  Université de Montpellier, IES - UMR UM/CNRS 5214, 860 Rue de St Priest, Bat. 5, Montpellier, France
Boch, Jérôme ;  Université de Montpellier, IES - UMR UM/CNRS 5214, 860 Rue de St Priest, Bat. 5, Montpellier, France
Carapelle, Alain  ;  Université de Liège - ULiège > Centres généraux > CSL (Centre Spatial de Liège) ; Centre Spatial de Liè,ge (CSL), Angleur, Belgium
Chapon, Arnaud;  ATRON METROLOGY, Cherbourg en Cotentin, France
Maraine, Tadec;  Université de Montpellier, IES - UMR UM/CNRS 5214, 860 Rue de St Priest, Bat. 5, Montpellier, France
Labau, Timothee;  Université de Montpellier, IES - UMR UM/CNRS 5214, 860 Rue de St Priest, Bat. 5, Montpellier, France
Saigné, Frédéric;  Université de Montpellier, IES - UMR UM/CNRS 5214, 860 Rue de St Priest, Bat. 5, Montpellier, France
Alía, Rubén García ;  European Organization for Nuclear Research (CERN), Genève 23, Switzerland
Language :
English
Title :
The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices
Publication date :
2023
Journal title :
IEEE Transactions on Nuclear Science
ISSN :
0018-9499
Publisher :
Institute of Electrical and Electronics Engineers (IEEE)
Pages :
1-1
Peer reviewed :
Peer Reviewed verified by ORBi
Additional URL :
http://xplorestaging.ieee.org/ielx7/23/4689328/10136833.pdf?arnumber=10136833
Funders :
CERN - Centre Européen de Recherche Nucléaire
EU - European Union
Available on ORBi :
since 28 May 2023

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