Meley, H.; DQMP, University of Geneva, 24 Quai E.-Ansermet, Geneva, Switzerland
Karandeep; Universit e de Li ege (B5), Li ege, Belgium
Oberson, L.; Interdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fe de rale de Lausanne (EPFL), Lausanne, Switzerland
De Bruijckere, J.; DQMP, University of Geneva, 24 Quai E.-Ansermet, Geneva, Switzerland, Delft University of Technology, Lorentzweg 1, Delft, Netherlands
Alexander, D. T. L.; Interdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fe de rale de Lausanne (EPFL), Lausanne, Switzerland
Triscone, J.-M.; DQMP, University of Geneva, 24 Quai E.-Ansermet, Geneva, Switzerland
Ghosez, Philippe ; Université de Liège - ULiège > Département de physique > Physique théorique des matériaux
Gariglio, S.; DQMP, University of Geneva, 24 Quai E.-Ansermet, Geneva, Switzerland
Language :
English
Title :
Erratum: Structural analysis of LaVO3 thin films under epitaxial strain
