Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics
Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics
All documents in ORBi are protected by a user license.
[en] Stiction is a major failure mode in micro electro-mechanical systems (MEMS).
Undesirable stiction, which results from contact between surfaces, threatens the
reliability of MEMS severely as it breaks the actuation function of MEMS switches
for example. Although it may be possible to avoid stiction by increasing restoring
forces using high spring constants, it follows that the actuation voltage has also to be
increased significantly, which reduces the efficiency. In our research, an
electrostatic-structural analysis is performed to estimate the proper design range of the
equivalent spring constant which is the main factor of restoring force in MEMS
switches. The upper limit of equivalent spring constant is evaluated based on the
initial gap width, the dielectric thickness, and the expected actuation voltage. The
lower limit is assessed on the value of adhesive forces between the two contacting
rough surfaces. The MEMS devices studied here are assumed to work in a dry
environment. In these operating conditions only the Van der Waals forces have to be
considered for adhesion. A statistical model is used to simulate the rough surface, and
the Maugis’s model is combined with Kim’s expansion to calculate adhesive forces. In
the resulting model, the critical value of the spring stiffness depends on the material
and surface properties, such as the elastic modulus, surface energy and surface
roughness. The aim of this research is to propose simple rules for design purposes.
Disciplines :
Mechanical engineering Engineering, computing & technology: Multidisciplinary, general & others
Author, co-author :
Wu, Ling ; Université de Liège - ULiège > Département d'aérospatiale et Mécanique > Vibrations
Rochus, Véronique ; Université de Liège - ULiège > Département d'aérospatiale et mécanique > LTAS - Vibrations et identification des structures
Noels, Ludovic ; Université de Liège - ULiège > Département d'aérospatiale et mécanique > Computational & Multiscale Mechanics of Materials (CM3)
Golinval, Jean-Claude ; Université de Liège - ULiège > Département d'aérospatiale et mécanique > LTAS - Vibrations et identification des structures
Language :
English
Title :
Influence of Adhesive Rough Surface Contact on Micro-Switches
Publication date :
01 December 2009
Journal title :
Journal of Applied Physics
ISSN :
0021-8979
eISSN :
1089-7550
Publisher :
American Institute of Physics, Melville, United States - New York
V. Rochus, D. J. Rixen, and J.-C. Golinval, Int. J. Numer. Methods Eng. 65, 461 (2006). 10.1002/nme.1450 (Pubitemid 43125852)
V. Rochus, Sens. Lett. 6, 88 (2008). 10.1166/sl.2008.012
C. H. Mastrangelo, Tribol. Lett. 3, 223 (1997). 10.1023/A:1019133222401
Z. Rymuza, Microsyst. Technol. 5, 173 (1999). 10.1007/s005420050160
R. Maboudian and R. T. Howe, J. Vac. Sci. Technol. B 15, 1 (1997). 10.1116/1.589247
N. Tas, T. Sonnenberg, H. Jansen, R. Legtenberg, and M. Elwenspoek, J. Micromech. Microeng. 6, 385 (1996), and references therein. 10.1088/0960-1317/6/ 4/005
R. Maboudian, Surf. Sci. Rep. 30, 207 (1998).
W. Merlijn van Spengen, R. Puers, and I. De Wolf, J. Micromech. Microeng. 12, 702 (2002). 10.1088/0960-1317/12/5/329 (Pubitemid 35046200)
A. Hariri, J. W. Zu, and R. Ben Mrad, J. Micromech. Microeng. 16, 1195 (2006). 10.1088/0960-1317/16/7/012 (Pubitemid 43884495)
A. Lumbantobing, L. Kogut, and K. Komvopoulos, J. Microelectromech. Syst. 13, 977 (2004). 10.1109/JMEMS.2004.838388 (Pubitemid 40009500)
J. A. Greenwood and J. B. P. Williamson, Proc. R. Soc. London, Ser. A 295, 300 (1966). 10.1098/rspa.1966.0242
K. L. Johnson, K. Kendall, and A. D. Roberts, Proc. R. Soc. London, Ser. A 324, 301 (1971). 10.1098/rspa.1971.0141
B. V. Derjaguin, V. M. Muller, and Y. P. Toporov, J. Colloid Interface Sci. 53, 314 (1975). 10.1016/0021-9797(75)90018-1
D. Maugis, Langmuir 11, 679 (1995). 10.1021/la00002a055
M. Zahn, Electromagnetic Field Theory: A Problem Solving Approach (Wiley, New York, 1979).
E. Barthel, J. Colloid Interface Sci. 200, 7 (1998). 10.1006/jcis.1997. 5309 (Pubitemid 28384260)
D. Maugis, J. Colloid Interface Sci. 150, 243 (1992). 10.1016/0021-9797(92)90285-T
K. L. Johnson and J. A. Greenwood, J. Colloid Interface Sci. 192, 326 (1997). 10.1006/jcis.1997.4984 (Pubitemid 27475411)
K. S. Kim, R. M. McMeeking, and K. L. Johnson, J. Mech. Phys. Solids 46, 243 (1998). 10.1016/S0022-5096(97)00070-7
R. W. Carpick, D. F. Ogletree, and M. Salmeron, J. Colloid Interface Sci. 211, 395 (1999). 10.1006/jcis.1998.6027 (Pubitemid 29394640)
O. Pítrement and M. Troyon, J. Colloid Interface Sci. 226, 166 (2000). 10.1006/jcis.2000.6808 (Pubitemid 30340926)
A. B. Yu, A. Q. Liu, Q. X. Zhang, and H. M. Hosseini, J. Micromech. Microeng. 16, 2157 (2006). 10.1088/0960-1317/16/10/032 (Pubitemid 44403667)
T. Lin, X. F. Bian, and J. Jiang, Phys. Lett. A 353, 497 (2006). 10.1016/j.physleta.2006.01.012 (Pubitemid 44399741)
M. P. Allen and D. J. Tildesley, Computer Simulation of Liquids, Clarendon Press, Oxford Science Publications p. 22 (1989).
Z. Zong, Y. F. Cao, N. Rahbar, and W. Soboyejo, J. Appl. Phys. 100, 104313 (2006). 10.1063/1.2388688 (Pubitemid 44853720)
W. R. Ashurst, C. Yau, C. Carraro, R. Maboudian, and M. T. Dugger, J. Microelectromech. Syst. 10, 41 (2001). 10.1109/84.911090 (Pubitemid 32287839)
J. A. Greenwood and J. H. Tripp, Proc. Inst. Mech. Eng. 185, 625 (1971).
M. O'Callaghan and M. A. Cameron, Wear 36, 79 (1976). 10.1016/0043-1648(76)90145-9
H. Lee, R. A. Coutu, S. Mall, and K. Leedy, J. Micromech. Microeng. 16, 557 (2006). 10.1088/0960-1317/16/3/011 (Pubitemid 43289733)
W. N. Sharpe, K. M. Jackson, K. J. Hemker, and Z. Xie, J. Microelectromech. Syst. 10, 317 (2001). 10.1109/84.946774 (Pubitemid 32981785)
K. Sato, M. Shikida, T. Yoshioka, T. Ando, and T. Kawabata, Solid State Sensors and Actuators, IEEE Transducers '97, Chicago, IL, Vol. 1, p. 595 (1997)
X. D. Li, B. Bhushana, and K. Takashimab, Ultramicroscopy 97, 481 (2003). 10.1016/S0304-3991(03)00077-9 (Pubitemid 36683321)
J. W. Wittwer, M. S. Baker, and L. L. Howell, J. Microelectromech. Syst. 15, 33 (2006). 10.1109/JMEMS.2005.859190 (Pubitemid 43210789)
C. Wilson and P. Beck, J. Microelectromech. Syst. 5, 142 (1996). 10.1109/84.536620
Y. Matsuoka, Y. Yamamoto, K. Yamada, S. Shimada, M. Tanabe, A. Yasukawa, and H. Matsuzaka, J. Micromech. Microeng. 5, 25 (1995). 10.1088/0960-1317/5/1/ 005
G. Rubio, N. Agrat, and S. Vieira, Phys. Rev. Lett. 76, 2302 (1996). 10.1103/PhysRevLett.76.2302
J. H. Kim, D. J. Srolovitz, and P.-R. Cha, J. Appl. Phys. 100, 054502 (2006). 10.1063/1.2336488 (Pubitemid 44422095)
J. W. Tringea and T. A. Uhlman, J. Appl. Phys. 93, 4661 (2003). 10.1063/1.1561998
X. Weihua, " Mechanical properties of materials at micro/nano scales.," Ph.D. thesis Hong Kong University, 2003.
H.-J. Butt, M. Farshchi-Tabrizi, and M. Kappl, J. Appl. Phys. 100, 024312 (2006). 10.1063/1.2210188 (Pubitemid 44179594)
R. Gissi and P. Decuzzi, J. Appl. Phys. 98, 014310 (2005). 10.1063/1.1944907 (Pubitemid 41049089)
M. P. de Boer and T. A. Michalske, J. Appl. Phys. 86, 817 (1999). 10.1063/1.370809
H.-J. Butt, B. Cappella, and M. Kappl, Surf. Sci. Rep. 59, 1 (2005). 10.1016/j.surfrep.2005.08.003
B. Stegemann, H. Backhaus, H. Kloss, and E. Santner, in Modern Research and Educational Topics in Microscopy, edited by, A. Ḿndez-Vilas, and, J. Diaz, (Formatex, Badajoz, Spain, 2007).
G. Gregori and D. R. Clarke, J. Appl. Phys. 100, 094904 (2006). 10.1063/1.2363745 (Pubitemid 44772651)
D. Erts, A. Lohmus, R. Lohmus, H. Olin, A. V. Pokropivny, L. Ryen, and K. Svensson, Appl. Surf. Sci. 188, 460 (2002). 10.1016/S0169-4332(01)00933-3 (Pubitemid 34551773)
P. Sahoo and A. Banerjee, J. Phys. D 38, 4096 (2005).
E. J. Thoreson, " From nanoscale to macroscale, using the atomic force microscope to quantify the role of few-asperity contacts in adhesion.," Ph.D. thesis Worcester Polytechnic Institute, 2006.
C. K. Boraa, E. E. Flater, M. D. Street, J. M. Redmond, M. J. Starr, R. W. Carpick, and M. E. Plesha, Tribol. Lett. 19, 37 (2005). 10.1007/s11249-005- 4263-8 (Pubitemid 40771407)
F. W. DelRio, M. L. Dunnb, and M. P. de Boer, Scr. Mater. 59, 916 (2008). 10.1016/j.scriptamat.2008.02.037
C. Gui, M. Elwenspoek, N. Tas, and J. G. E. Gardeniers, J. Appl. Phys. 85, 7448 (1999). 10.1063/1.369377
H. Kwon, S.-S. Jang, Y.-H. Park, Y.-D. Kim, H.-J. Nam, and Y.-C. Joo, J. Micromech. Microeng. 18, 105010 (2008). 10.1088/0960-1317/18/10/105010