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An EMI resistant integrated LVDS transmitter in 0.18μm CMOS
Matig-A, G.; Yuce, M. R.; Redouté, Jean-Michel
2014In IEEE International Symposium on Electromagnetic Compatibility, p. 692-697
Peer reviewed
 

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Keywords :
Amplification; CMOS integrated circuits; Electromagnetic compatibility; Electromagnetic pulse; Closed loop gain; CMOS processs; Common mode feedback; Differential data; Eye openings; Independent driving; Low voltage differential signaling; LVDS transmitters; Transmitters
Abstract :
[en] In this paper, an on-chip method of compensating the effects of electromagnetic interference (EMI) on a low voltage differential signaling (LVDS) transmitter is presented. The proposed structure provides a level of linearity that enables the transmitter to maintain a wide differential opening by achieving a superior common-mode level independent driving current and common-mode feedback (CMFB) closed loop gain. Simulations illustrate that the proposed LVDS transmitter structure maintains an eye opening of at least 150mV and effectively transmits differential data in presence of an EMI ranging from 1MHz to 2GHz with an amplitude of up to 5V. This EMI robust LVDS transmitter was designed in the UMC 0.18μm CMOS process. © 2014 IEEE.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Matig-A, G.;  Biomedical Integrated Circuits and Sensors Laboratory, Dept. of Electrical and Computer Systems Engineering, Monash University, Melbourne, VIC, Australia
Yuce, M. R.;  Biomedical Integrated Circuits and Sensors Laboratory, Dept. of Electrical and Computer Systems Engineering, Monash University, Melbourne, VIC, Australia
Redouté, Jean-Michel  ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés
Language :
English
Title :
An EMI resistant integrated LVDS transmitter in 0.18μm CMOS
Publication date :
2014
Event name :
2014 International Symposium on Electromagnetic Compatibility, EMC Europe 2014
Event date :
1 September 2014 through 4 September 2014
Audience :
International
Journal title :
IEEE International Symposium on Electromagnetic Compatibility
ISSN :
1077-4076
Publisher :
Institute of Electrical and Electronics Engineers Inc.
Pages :
692-697
Peer reviewed :
Peer reviewed
Commentary :
9781479932252
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