Electromagnetic compatibility; Integrated circuits; Reconfigurable hardware; Charge pump; Conducted emissions; Frequency performance; Line impedance; TEM cell; Test method; Networks (circuits)
J.-M Redoute and M. Steyaert, EMC of Analog Integrated Circuits, New York, NY, USA: Springer, 2010.
S. Ben Dhia and M. Ramdani, Electromagnetic Compatibility of Integrated Circuits, New York, NY, USA: Springer, 2006.
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohml1500hm direct coupling method, IEC 61967-4 edl.l, 2006.
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions, IEC 61967-1 ed1.0, 2002.
Vehicles, boats and internal combustion engines - Radio disturbance characteristics - Limits and methods of measurement for the protection of on-board receivers, CISPR 25, 2010.
J. Malack, "Statistical Correlation Between Conducted Voltages on the Powerline and The Measured with a Line-Impedance Stabilization Network", IEEE Trans. Electromagn. Compat, vol. 20, no. 2, pp. 346-349, May, 1978.
B. Deutschmann, G. Winkler, and R. Jungreithmair, "Measuring the electromagnetic emissions of integrated circuits with lEC 61967-4 (the measuring method and its weaknesses)", IEEE Int. Symp. on Electromagnetic Compatibility, Minneapolis, MN, USA, 2002, pp. 407-412.
F. Fiori and F. Musolino, "Comparison of IC Conducted Emission Measurement Methods", IEEE Trans. Instrum. Meas, vol. 52, no. 3, pp. 839-845, June, 2003.
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions, TEM-cell method, IEC 61967-2, 2005.
H. Kang, W. Jung, K. Kim, H. Park and S. Kim, "Equivalent circuit model of IC-Stripline Coupling to IC Package", IEEE 18th Workshop on Signal and Power Integrity, Ghent, Belgium, pp. 1-4,2014.
H. Weng, D. Beetner and R. DuBroff, "Predicting TEM cell measurements from near field scan data", IEEE Int. Symp. on Electromagnetic Compatibility, Portland, OR, USA, 2006.
A. Engel, "Model of IC Emissions into a TEM Cell", IEEE Int. Symp. on Electromagnetic Compatibility, Austin, TX, USA, pp. 197-202, 1997.
F. Fiori, F. Musolino and Y. Pozzolo, "Weakness of the TEM Cell Method in Evaluating IC Radiated Emissions", IEEE Int. Symp. on Electromagnetic Compatibility, vol. 1, pp. 135-138, 2001.
S. Okuyama,K . Osabe,K . Tanakajima and H. Muramatsu," Investigation on Effectiveness of Very High Frequency Line Impedance Stabilization Network (VHF-USN) for Measurement Reproducibility", Int. Symp. on Electromagnetic Compatibility (EMC EUROPE), Brugge, Belgium, pp. 174-179,2003.