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An evaluation and comparison of conducted emission test methods for Integrated Circuits

Kennedy, S.; Yuce, M. R.; Redouté, Jean-Michel

2015 • In Conference Proceedings - GEMCCON 2015: IEEE Global Electromagnetic Compatibility Conference

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2015 - An evaluation and comparison of conducted emission test methods for Integrated Circuits.pdf

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2015 - An evaluation and comparison of conducted emission test methods for Integrated Circuits.pdf

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