Investigating lunar 2-dimensional topographic properties at different spatial scales using lunar orbiter laser altimetter data and the wavelet leaders method

Lemelin, Myriam; Daly, Mike; Deliège, Adrien

Poster (Scientific congresses and symposiums)

Lemelin, Myriam; Daly, Mike; Deliège, Adrien

2019 • 50th Lunar and Planetary Science Conference

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https://hdl.handle.net/2268/234562

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Keywords :

Lunar topographic properties; multifractal analysis; wavelet leaders method; holder/scaling exponent

Disciplines :

Mathematics
Physical, chemical, mathematical & earth Sciences: Multidisciplinary, general & others

Author, co-author :

Lemelin, Myriam

Daly, Mike

Deliège, Adrien ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Télécommunications

Language :

English

Title :

Investigating lunar 2-dimensional topographic properties at different spatial scales using lunar orbiter laser altimetter data and the wavelet leaders method

Publication date :

2019

Event name :

50th Lunar and Planetary Science Conference

Event place :

United States - Texas

Event date :

18-22 mars 2019

Audience :

International

Available on ORBi :

since 20 April 2019

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