EMI resisting smart-power integrated LIN driver with reduced slope pumping

Automobile drivers; Electromagnetic compatibility; Electromagnetic pulse; Networks (circuits); Circuit switches; Direct power injections; Electromagnetic interferences; Local Interconnect networks; Low powers; Integrated circuits

Abstract :

[en] This paper presents the design of a Local Interconnect Network (LIN) smart-power driver exhibiting a high degree of immunity against electromagnetic interference (EMI). Improving previous designed architectures, this circuit switches to a low power consumption mode when there is no EMI, while presenting an increased immunity to slope pumping. Measurements illustrate that this proposed LIN driver complies to the 5W direct power injection (DPI) specification. © 2008 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Steyaert, M.; Dept. ESAT, MICAS, Katholieke Universiteit Leuven, Heverlee, Belgium

Language :

English

Title :

EMI resisting smart-power integrated LIN driver with reduced slope pumping

Publication date :

2008

Event name :

IEEE 2008 Custom Integrated Circuits Conference, CICC 2008

Event date :

21 September 2008 through 24 September 2008

Audience :

International

Journal title :

Proceedings of the Custom Integrated Circuits Conference

ISSN :

0886-5930

Pages :

643-646

Peer reviewed :

Peer reviewed

Funders :

IEEE Solid-State Circuits Society

Commentary :

74829

Available on ORBi :

since 08 March 2019

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Bibliography

LIN Consortium, LIN specification package revision 2.0, http://www.linsubbus.org, available online.
H. Casier, "Electronic circuits in an automotive environment", International Solid-State Circuits Conference, tutorial, February 2004.
K. Appeltans, "LIN transceivers: a case study of automotive design", International Solid-State Circuits Conference, ATAC design forum, Feb. 2005.
J.-M. Redouté, M. Steyaert, "An EMI resisting LIN driver in 0.35-micron high-voltage CMOS", IEEE Journal of Solid-State Circuits, vol. 42, no. 7, pp. 1574-1582, July 2007.
IEC 62132-4, Ed. 1: IC's Measurement of E/M immunity 150 kHz to 1GHz - Part 4: Direct RF power injection method.
J.-M. Redouté, M. Steyaert, "Current mirror structure insensitive to conducted EMI", IEE Electronics Letters, vol. 41, no. 21, October 2005, pp. 1145-1146.
W. M. C. Sansen, Analog design essentials, Springer, 2006.