An integrated DC current regulator with high EMI suppression

Bias currents; Electric current regulators; Electromagnetic compatibility; Electromagnetic waves; Networks (circuits); Topology; Conducted electromagnetic interference; DC currents; European; Solid-State Circuits Conference; Electromagnetic pulse

Abstract :

[en] This paper presents an integrated DC current regulator using resistive trimming, which provides a high degree of immunity against conducted electromagnetic interference (EMI). While classic topologies generate erratic bias currents the moment EMI is injected into the circuit, this new topology continues to deliver the same reference DC current, whether or not EMI is present. © 2007 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Walravens, C.; Dept. ESAT, MICAS, Katholieke Universiteit Leuven, Heverlee, Belgium

Van Winckel, S.; Dept. ESAT, MICAS, Katholieke Universiteit Leuven, Heverlee, Belgium

Steyaert, M.; Dept. ESAT, MICAS, Katholieke Universiteit Leuven, Heverlee, Belgium

Language :

English

Title :

An integrated DC current regulator with high EMI suppression

Publication date :

2007

Event name :

ESSCIRC 2007 - 33rd European Solid-State Circuits Conference

Event date :

11 September 2007 through 13 September 2007

Audience :

International

Journal title :

ESSCIRC 2007 - Proceedings of the 33rd European Solid-State Circuits Conference

Pages :

420-423

Peer reviewed :

Peer reviewed

Commentary :

72159 1424411254; 9781424411252

Available on ORBi :

since 08 March 2019

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Bibliography

J. J. Goedbloed, Electromagnetic Compatibility, Deventer, the Netherlands: Kluwer, 2001, 2nd edition, chapter 9.
J.-M. Redouté, M. Steyaert, "Current mirror structure insensitive to conducted EMI", Electronics Letters, vol. 41, no. 21, October 2005, pp. 1145-1146.
H. Casier, "Electronic circuits in an automotive environment", International Solid State Circuits Conference, 2004, tutorial.
IEC 62132-4, Ed.1: ICs, Measurement of E/M immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method.
P. R. Gray, P. J. Hurst, S. H. Lewis, R. G. Meyer, Analysis and Design of Analog Integrated Circuits, John Wiley&sons, inc., 2001, ch. 8, pp 593-599 and pp. 637-644.
K. Dutton, S. Thompson and B. Barraclough, The Art of Control Engineering, Addison Wesley Longman, 1997, ch. 3.
P. Wambacq and W. M. C. Sansen, Distortion Analysis of Analog Integrated Circuits, Kluwer Academic Publishers, 1998, ch. 4.