[en] This paper presents two electromagnetic interference (EMI) resisting current mirror topologies that use a linearization technique to filter out the EMI without producing any offset at the output. A proposed current mirror illustrating the linearization concept is implemented in standard 0.18 μm mixed-mode CMOS technology. Measurement results show that for a frequency range of 10 kHz-10 MHz, the EMI-induced offset current produced by the proposed current mirror is negligible as compared to the traditional current mirror.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Pudi, N. S. A. K.; IITB-Monash Research Academy, Indian Institute of Technology Bombay, Mumbai 400076, India(e-mail: anjankumar@ee.iitb.ac.in).
Boyapati, S.; IITB-Monash Research Academy, Indian Institute of Technology Bombay, Mumbai 400076, India(e-mail: bsubrahmanyam@ee.iitb.ac.in).
Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés
Baghini, M. S.; Department of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai 400076, India
Language :
English
Title :
Analytical and Experimental Validation of Robustness of the Current Mirrors to EMI
Publication date :
2018
Journal title :
IEEE Transactions on Electromagnetic Compatibility
ISSN :
0018-9375
eISSN :
1558-187X
Publisher :
Institute of Electrical and Electronics Engineers Inc.
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