A Generic EMI-Immune Technique for Differential Amplifiers With Single-Ended Output

CMOS; Capacitors; CMOS integrated circuits; Differential amplifiers; Electromagnetic pulse; Electromagnetic wave interference; Load testing; Logic gates; Operational amplifiers; Signal interference; Transistors; CMOS technology; Frequency ranges; Immunity testing; Load modeling; Mathematical analysis; Offset voltage; Operating condition; Optimal solutions; Capacitance

Abstract :

[en] This paper presents a unique methodology to calculate the filtering capacitances of the OpAmp already reported in the literature. The methodology aims to show that there is an optimal solution that can be used to increase the electromagnetic interference (EMI) immunity of any OpAmp for a wide range of frequencies. By using this proposed methodology, an OpAmp structure that reduces the EMI effect is designed in standard 0.18 μm mixed-mode CMOS technology. Detailed mathematical analyses and simulation results are presented and discussed. Simulation results show that the maximum EMI-induced offset voltage in the frequency range from 1 MHz to 1 GHz for the OpAmp is 4.4 mV. In contrast, the standard Miller OpAmp exhibits a maximum EMI-induced offset voltage of 92.4 mV under the same operating conditions. © 2017 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Anjan Kumar Pudi, N. S.; IITB-Monash Research Academy, Indian Institute of Technology Bombay, Mumbai, 400076, India

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Baghini, M. S.; Department of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, 400076, India

Language :

English

Title :

A Generic EMI-Immune Technique for Differential Amplifiers With Single-Ended Output

Publication date :

2018

Journal title :

IEEE Transactions on Electromagnetic Compatibility

ISSN :

0018-9375

eISSN :

1558-187X

Publisher :

Institute of Electrical and Electronics Engineers Inc.

Volume :

Issue :

Pages :

958-964

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 04 February 2019

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Bibliography

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