Event Related Potentials; Single Trial ERP extraction; Wavelet Denoising
Abstract :
[en] Event Related Potentials (ERPs) are generated in
ongoing brain electrical activity due to visual, auditory, or
sensory stimuli. These signals have very low SNR and are
contaminated by background EEG. Extraction of single trial
ERPs from background EEG is a challenging task due to
overlapping nature of the frequency bands of ERP and EEG
signals and much higher power of EEG than ERPs. In this
paper we proposed a method based on wavelet transform and
adaptive noise cancelers in order to extract single trial ERPs
from background EEG in very low SNR conditions. Simulation
results show the superiority of the proposed algorithm over the
existing methods. In addition, performance of the algorithm is
justified under different noise models namely White Gaussian
Noise, Auto Regressive, and Real EEG signals
Disciplines :
Electrical & electronics engineering
Author, co-author :
Mortaheb, Sepehr ; Isfahan University of Technology > Department of Electrical and Computer Engineering > Digital Signal Processing Lab
Rostami, Farzad; Isfahan University of Technology > Department of Electrical and Computer Engineering > Digital Signal Processing Lab
Shahin, Safoura; Isfahan University of Technology > Department of Electrical and Computer Engineering > Digital Signal Processing Lab
Amirfattahi, Rassoul; Isfahan University of Technology > Department of Electrical and Computer Engineering > Digital Signal Processing Lab
Language :
English
Title :
Wavelet Based Single Trial Event Related Potential Extraction in Very Low SNR Conditions
Publication date :
October 2016
Event name :
6th International Conference on Computer and Knowledge Engineering (ICCKE 2016)
Event date :
from 20-10-2016 to 21-10-2016
Main work title :
2016 6th International Conference on Computer and Knowledge Engineering (ICCKE)
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