S. Ben Dhia, Mohamed Ramdani, and Etienne Sicard Electromagnetic compatibility of integrated circuits 2006 Springer
S. Ben Dhia, and A. Boyer Long-term electro-magnetic robustness of integrated circuits: EMRIC research project Microelectron Reliab 53 9-11 2013 1266 1272
C. Bona, and F. Fiori MOS power transistor model for electromagnetic susceptibility analysis Microelectron Reliab 51 8 2011 1356 1364
E. Sicard, and J.M. Dienot Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility Microelectron Reliab 45 9-11 2005 1277 1284
J.-M. Redouté, and M. Steyaert EMC of analog integrated circuits 2010 Springer
Y.-C. Chen, W.-H. Hsu, S.-H. Cheng, and Y.T. Cheng A power sensor tag with interference reduction for electricity monitoring of two-wire household appliances IEEE Trans Ind Electron 61 4 2014 2062 2070
M. Coenen, and J. Goedbloed Electromagnetic compatibility 2010 Mybusinessmedia BV
P. Besse, K. Abouda, and C. Abouda Identifying electrical mechanisms responsible for functional failures during harsh external ESD and EMC aggression Microelectron Reliab 51 9-11 2011 1597 1601
J.-B. Gros, G. Duchamp, J.-L. Levant, and C. Marot Control of the electromagnetic compatibility: an issue for IC reliability Microelectron Reliab 51 9-11 2011 1493 1497
R. Isermann, R. Schwarz, and S. Stolzl Fault-tolerant drive-by-wire systems IEEE Control Syst Mag 22 5 2002 64 81
Aiello O, Redouté J-M. Design of a neural recording amplifier robust to EMI. In Asia-Pacific international EMC symposium and exhibition. Melbourne, Australia; 2013.
O. Aiello, and F. Fiori A new MagFET-based integrated current sensor highly immune to EMI Microelectron Reliab 53 4 2013 573 581
Measurement of E/M Immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method, IEC 62132-4, Ed. 1: ICs; 2004.
Compagne E, Maulet S, Genevey S. An analog front-end for remote sensor applications with high input common-mode rejection including a 16 bit Sigma-Delta ADC in 0.35 μm 3.3 V CMOS Process. In IEEE European solid-state circuits conference (ESSCIRC), Leuven, Belgium; 2004. p. 459-62.
Michel F, Steyaert M. Differential input topologies with immunity to electromagnetic interference. In IEEE European solid-state circuits conference (ESSCIRC). Helsinki, Finland; 2011. p. 203-6.
F. Michel, and M. Steyaert Comparison of high impedance input topologies with low EMI susceptibility Analog Integr Circ Sig Process 65 2 2010 299 309
F. Fiori Design of an operational amplifier input stage immune to EMI IEEE Trans Electromagn Compat 49 4 2007
J.-M. Redouté, and M. Steyaert EMI resistant CMOS differential input stages IEEE Trans Circ Syst I 57 2 2010 323 331
R.S. Assaad, and J. Silva-Martinez The recycling folded cascode: a general enhancement of the folded cascode amplifier IEEE J Solid State Circ 44 9 2009 2535 2542
Redouté JM, Richelli A. A fundamental approach to EMI resistant folded cascode operational amplifier design. In EMC Europe 2013, Bruges, Belgium, 2013. p. 203-8.
G. Masetti, S. Graffi, D. Golzio, and Zs.M. Kovács-Vajna Failures induced on analog integrated circuits from conveyed electromagnetic interferences: a review Microelectron Reliab 36 7/8 1996 955 972
G. Setti, and N. Speciale Design of a low EMI susceptibility CMOS operational amplifier Microelectron Reliab 38 1998 1143
Masetti G, Setti G, Speciale N. On the key role of parasitic capacitances in the determination of susceptibility to EMI of integrated operational amplifiers. In Proc. EMC99 Zurich; 1999.
F. Fiori New grounding scheme to reduce electromagnetic emission of smart-power system-on-chips IEEE Trans Power Electron 27 1 2012 224 234
C. Widemann, S. Stegemann, W. John, and W. Mathis Analytic investigations on the susceptibility of nonlinear analog circuits to substrate noise Adv Radio Sci 11 2013 171 175
A. Richelli CMOS opamp resisting to large electromagnetic interferences IEEE Trans Electromagn Compat 52 4 2010 1062 1065
A. Richelli, L. Colalongo, and Zs.M. Kovács-Vajna Increasing the immunity to electromagnetic interferences of CMOS operational amplifiers IEEE Trans Reliab 52 3 2003 349 353
S. Graffi, G. Masetti, and A. Piovaccari Criteria to reduce failures induced from conveyed electromagnetic interferences on CMOS operational amplifiers Microelectron Reliab 37 1 1997 95 113
A. Richelli Increasing EMI immunity in novel Low-voltage CMOS OpAmps IEEE Trans Electromagn Compat 54 4 2012 947 950
C. Walravens, S. Van Winckel, J.M. Redouté, and M. Steyaert Efficient reduction of electromagnetic interference effects in operational amplifiers Electron Lett 43 2 2007 84 85
A. Alaeldine, R. Perdriau, and A. Haidar A comprehensive simulation model for immunity prediction in integrated circuits with respect to substrate injection Microelectron J 40 12 2009 1788 1795
