Reference : Kuijk bandgap voltage reference with high immunity to EMI
Scientific journals : Article
Engineering, computing & technology : Electrical & electronics engineering
http://hdl.handle.net/2268/229084
Kuijk bandgap voltage reference with high immunity to EMI
English
Redouté, Jean-Michel mailto [Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés >]
Steyaert, M. [Microelectronics and Sensors Division (MICAS), Department of Electrical Engineering (ESAT), Katholieke Universiteit Leuven, 3001 Heverlee, Belgium]
2010
IEEE Transactions on Circuits and Systems. Part II, Express Briefs
57
2
75-79
Yes (verified by ORBi)
International
1549-7747
1558-3791
[en] Bandgap voltage references ; Electromagnetic compatibility ; Electromagnetic interference ; Bandgap voltage reference ; Conducted electromagnetic interference ; Kuijk bandgap ; Original structures ; Power supply ; Electromagnetic wave interference ; Electromagnetism ; Energy gap ; Voltage measurement ; Electromagnetic pulse
[en] This brief evaluates the effect of conducted electromagnetic interference (EMI) that is injected in the power supply of a classic Kuijk bandgap reference voltage circuit. Two modified Kuijk bandgap topologies with high immunity to EMI are introduced and compared to the original structure. Measurements of a test IC confirm the theoretical analyses. © 2010 IEEE.
IWT
http://hdl.handle.net/2268/229084
10.1109/TCSII.2009.2037991

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