Kuijk bandgap voltage reference with high immunity to EMI

Bandgap voltage references; Electromagnetic compatibility; Electromagnetic interference; Bandgap voltage reference; Conducted electromagnetic interference; Kuijk bandgap; Original structures; Power supply; Electromagnetic wave interference; Electromagnetism; Energy gap; Voltage measurement; Electromagnetic pulse

Abstract :

[en] This brief evaluates the effect of conducted electromagnetic interference (EMI) that is injected in the power supply of a classic Kuijk bandgap reference voltage circuit. Two modified Kuijk bandgap topologies with high immunity to EMI are introduced and compared to the original structure. Measurements of a test IC confirm the theoretical analyses. © 2010 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Steyaert, M.; Microelectronics and Sensors Division (MICAS), Department of Electrical Engineering (ESAT), Katholieke Universiteit Leuven, 3001 Heverlee, Belgium

Language :

English

Title :

Kuijk bandgap voltage reference with high immunity to EMI

Publication date :

2010

Journal title :

IEEE Transactions on Circuits and Systems. II, Express Briefs

ISSN :

1549-7747

eISSN :

1558-3791

Publisher :

Institute of Electrical and Electronics Engineers (IEEE), Piscataway, United States - New Jersey

Volume :

Issue :

Pages :

75-79

Peer reviewed :

Peer Reviewed verified by ORBi

Funders :

IWT - Agentschap voor Innovatie door Wetenschap en Technologie

Available on ORBi :

since 04 November 2018

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Bibliography

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