Article (Scientific journals)
An externally trimmed integrated DC current regulator insensitive to conducted EMI
Redouté, Jean-Michel; Walravens, C.; Van Winckel, S. et al.
2008In IEEE Transactions on Electromagnetic Compatibility, 50 (1), p. 63-70
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Keywords :
CMOS analog integrated circuits; Electromagnetic interference (EMI); Electromagnetic susceptibility; Capacitors; CMOS integrated circuits; Electric filters; Electric network topology; Signal interference; Analog integrated circuits; Integrated DC current regulator; On-chip capacitors; Electric current regulators
Abstract :
[en] This paper introduces a new integrated dc current regulator using external resistive trimming, which presents a high degree of immunity against conducted electromagnetic interference (EMI). While classic topologies generate erratic bias currents that are totally different from the expected value once EMI is injected into the circuit, this new topology succeeds in producing the same fixed dc current, whether EMI is present or not. Extra filtering requiring small on-chip capacitors ensures that the ripple on the output current due to the interference remains at a very low value. © 2008 IEEE.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Redouté, Jean-Michel  ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés
Walravens, C.;  Department of Electrical Engineering Microelectronics and Sensors, Katholieke Universiteit Leuven, 3001 Leuven, Belgium
Van Winckel, S.;  Department of Electrical Engineering Microelectronics and Sensors, Katholieke Universiteit Leuven, 3001 Leuven, Belgium
Steyaert, M. S. J.;  Department of Electrical Engineering Microelectronics and Sensors, Katholieke Universiteit Leuven, 3001 Leuven, Belgium
Language :
English
Title :
An externally trimmed integrated DC current regulator insensitive to conducted EMI
Publication date :
2008
Journal title :
IEEE Transactions on Electromagnetic Compatibility
ISSN :
0018-9375
eISSN :
1558-187X
Publisher :
Institute of Electrical and Electronics Engineers, United States
Volume :
50
Issue :
1
Pages :
63-70
Peer reviewed :
Peer Reviewed verified by ORBi
Funders :
IWT, OIST PC, Okinawa Institute of Science and Technology Promotion Corporation
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