Measurement of EMI induced input offset voltage of an operational amplifier

Redouté, Jean-Michel; Steyaert, M.

doi:10.1049/el:20071017

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Article (Scientific journals)

Measurement of EMI induced input offset voltage of an operational amplifier

Redouté, Jean-Michel; Steyaert, M.

2007 • In Electronics Letters, 43 (20), p. 1088-1090

Peer Reviewed verified by ORBi

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https://hdl.handle.net/2268/229080

DOI
10.1049/el:20071017

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Keywords :

Electric potential; Measurement theory; Signal interference; Measurement technique; Offset voltage; Operational amplifiers

Abstract :

[en] An efficient measurement technique is introduced for determining the input referred offset voltage induced by electromagnetic interference (EMI) in operational amplifiers. © The Institution of Engineering and Technology 2007.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Steyaert, M.; Departement Elektrotechniek, Afdeling ESAT-MICAS, Katholieke Universiteit Leuven, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium

Language :

English

Title :

Measurement of EMI induced input offset voltage of an operational amplifier

Publication date :

2007

Journal title :

Electronics Letters

ISSN :

0013-5194

eISSN :

1350-911X

Publisher :

Institute of Electrical Engineers, United Kingdom

Volume :

Issue :

Pages :

1088-1090

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 04 November 2018

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Bibliography

Fiori, F., and Crovetti, P.S.: ' Nonlinear effects of radio-frequency interference in operational amplifiers ', IEEE Trans. Circuits Syst., I, Fundam. Theory Appl., 2002, 49, p. 367-372 10.1109/81.989173 1057-7122
Richelli, A., Colalongo, L., Kovacs-Vajna, Z.M., and Quarantelli, M.: ' Design of an integrated CMOS operational amplifier with low probability EMI induced failures ', European Solid-State Circuits Conf. (ESSCIRC), Villach, Austria, 2001, p. 361-364
Fiori, F.: ' Operational amplifier stage robust to EMI ', Electron. Lett., 2001, 37, p. 930-931 10.1049/el:20010651 0013-5194
Redouté, J.-M., and Steyaert, M.: ' EMI resisting CMOS differential pair structure ', Electron. Lett., 2006, 42, p. 1217-1218 10.1049/el:20062059 0013-5194