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Image-plane fringe tracker for adaptive-optics assisted long baseline interferometry
Ireland, Michael J.; Defrere, Denis; Martinache, Frantz et al.
2018In Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
 

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Keywords :
Fringe sensing; VLTI; Hi-5; Planetary systems; Nulling; Integrated optics; PFI
Abstract :
[en] Accurate fringe tracking is essential for sensitive long-wavelength thermal background limited operation of the current Very Large Telescope Interferometry (VLTI) and future Planet Formation Imager (PFI) facilities. We present and simulate a dual fringe tracking and low-order adaptive optics concept based on a combination of non-redundant aperture interferometry and eigenphase in asymmetric pupil wavefront sensing. This scheme can acquire fringes at many wavelengths of path length offset between telescopes, even with moderate tilt offset and pupil shifts between beams. Once locked to fringes, our technique can also be used for simultaneous low-order wavefront sensing, and has near-optimum sensitivity where there is a dominant point-source image component. This concept is part of the Heimdallr visitor instrument currently being investigated for VLTI.
Disciplines :
Space science, astronomy & astrophysics
Author, co-author :
Ireland, Michael J.;  The Australian National Univ. (Australia)
Defrere, Denis ;  Université de Liège - ULiège > Département d'astrophys., géophysique et océanographie (AGO) > ISSPSILAB
Martinache, Frantz;  Univ. Côte d'Azur, Observatoire de la Côte d'Azur, CNRS, Lab. Lagrange (France)
Monnier, John D.;  Univ. of Michigan (United States)
Norris, Barnaby;  The Univ. of Sydney (Australia)
Tuthill, Peter;  The Univ. of Sydney (Australia)
Woillez, Julien;  European Southern Observatory (Germany))
Language :
English
Title :
Image-plane fringe tracker for adaptive-optics assisted long baseline interferometry
Publication date :
09 July 2018
Event name :
2018 Optical and Infrared Interferometry and Imaging VI
Event date :
11 June 2018 through 15 June 2018
Audience :
International
Main work title :
Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
ISBN/EAN :
9781510619555
Commentary :
ISBN: 0701
Available on ORBi :
since 23 October 2018

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