A methodological approach to EMI resistant analog integrated circuit design

Analog circuits; Electromagnetic pulse; Integrated circuit design; Integrated circuit manufacture; Integrated circuits; Operational amplifiers; Methodological approach; Analog integrated circuits

Abstract :

[en] This paper describes the effect of EMI (electromagnetic interference) on analog integrated circuits, and introduces four design guidelines targeted at improving the susceptibility of analog integrated circuits to EMI. These guidelines are then applied to the practical design of operational amplifier topologies with a high degree of immunity to conductive EMI. © 2012 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Richelli, A.; Dept. of Information Engineering, University of Brescia, Italy

Language :

English

Title :

A methodological approach to EMI resistant analog integrated circuit design

Publication date :

2015

Journal title :

IEEE Electromagnetic Compatibility Magazine

ISSN :

2162-2264

eISSN :

2162-2272

Publisher :

Institute of Electrical and Electronics Engineers Inc.

Volume :

Issue :

Pages :

92-100

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 25 September 2018

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Bibliography

M. Ramdani, E. Sicard, A. Boyer, S. Ben Dhia, J. J. Whalen, T. H. Hubing, M. Coenen and O. Wada, "The Electromagnetic Compatibility of Integrated Circuits-Past, Present and Future", IEEE Transactions on Electromagnetic Compatibility, vol. 51, no. 1, pp. 78-100, Feb. 2009.
I. Chahine, M. Kadi, E. Gaboriaud, A. Louis, B. Mazari, "Characterization and Modeling of the Susceptibility of Integrated Circuits to Conducted Electromagnetic Disturbances Up to 1 GHz", IEEE Transactions on Electromagnetic Compatibility, vol. 50, no. 2, pp. 285-293, 2008.
V. Ceperic and A. Baric, "Modelling of Electromagnetic Immunity of Integrated Circuits by Artificial Neural Networks", International Zurich Symposium on Electromagnetic Compatibility, 2009.
X.-K. Gao, E.-K. Chua, E.-P. Li , "Behavioral modeling for electromagnetic immunity analysis for electronic systems", IEEE Asia-Pacific International Symposium on Electromagnetic Compatibility, 2010.
I. Gil and R. Fernandez-Garcia, "Characterization and modelling of EMI susceptibility in integrated circuits at high frequency", IEEE International Symposium on Electromagnetic Compatibility, 2012.
S. Hairoud, T. Dubois, A. Tetelin, G. Duchamp, "Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling", International Symposium on Electromagnetic Compatibility (EMC COMPO), 2013.
F. Fiori, P. Crovetti, "Prediction of high-power EMI effects in CMOS operational amplifiers", IEEE Transactions on Electromagnetic Compatibility, vol. 48, no. 1, pp. 153-160, 2006.
S. Ben Dhia, A. Boyer, B. Vrignon, M. Deobarro, T. V. Dinh, "On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations", IEEE Transactions on Instrumentation and Measurement, vol. 61, no. 3, pp. 696-707, 2012.
R. Perdriau, O. Maurice, S. Dubois, M. Ramdani, E. Sicard, "Exploration of radiated electromagnetic immunity of integrated circuits up to 40 GHz", IET Electronics Letters, vol. 47, no. 10, 2012.
J. Loeckx, T. Deman, T. McConaghy, G. Gielen, "EMI-immune analogue circuit generated through genetic evolution", IET Electronics Letters, vol. 45, no. 4, 2009.
J.-M. Redouté and M. Steyaert, EMC of Analog Integrated Circuits, Springer, 2010.
C. R. Paul, Introduction to Electromagnetic Compatibility, John Wiley and Sons, 1992.
A. S. Poulton, "Effect of conducted EMI on the DC performances of operational amplifiers", IET Electronics Letters, vol. 30, pp. 282-284, 1994.
G. Masetti, S. Graffi, D. Golzio and Zs. M. Kovacs-Vajna, "Failures Induced on Analog Integrated Circuits from Conveyed Electromagnetic Interferences: a Review",Microelectronics and Reliability, vol. 36, no. 7/8, pp. 995-972,1996.
G. Setti and N. Speciale, "Design of a Low EMI Susceptibility CMOS Operational Amplifier", Microelectronics and Reliability, vol. 38, pp. 1143, 1998.
S. Ben Dhia, M. Ramdani and E. Sicard, Electromagnetic Compatibility of Integrated Circuits, Springer, 2006.
T. Dubois, J.-J. Laurin, J.-J., J. Raoult, S. Jarrix, "Effect of Low and High Power Continuous Wave Electromagnetic Interference on a Microwave Oscillator System: From VCO to PLL to QPSK Receiver", IEEE Transactions on Electromagnetic Compatibility, vol. 56, no. 2, pp. 286-293, 2014.
J.-M. Redouté and M. Steyaert, "EMI Resistant CMOS Differential Input Stages", IEEE Transactions on Circuits and Systems I, vol. 57, no. 2, pp. 323-331, 2010.
F. Fiori, "Design of an Operational Amplifier Input Stage Immune to EMI," IEEE Transactions on Electromagnetic Compatibility, vol. 49, no. 4, Nov. 2007.
F. Michel and M. Steyaert, "Comparison of high impedance input topologies with low EMI susceptibility," Analog Integrated Circuits and Signal Processing, vol. 65, no. 2, pp. 299-309, Apr. 2010.
F. Fiori and P. S. Crovetti, "Complementary differential pair with high immunity to RFI," IET Electronics Letters, vol. 38, no. 25, pp. 1663-1664, Dec. 2002.
P. S. Crovetti, "Operational Amplifier Immune to EMI with no baseband performance degradation," IET Electronics Letters, vol. 46, no. 3, Feb. 2010.
Zs. M. Kovacs-Vajna, E. Sardini and N. Speciale, "Chaotic Behaviour of 741 opamps Subjected to EMI Conveyed to Power Supply Rails," IEEE International Symposium on Circuits and Systems, vol.1, pp. 727-730, 2000.
N. Lacrampe, A. Alaeldine, F. Caignet, R. Perdriau, M. Bafleur, N. Nolhier, M. Ramdani, "Investigation on ESD Transient Immunity of Integrated Circuits", IEEE International Symposium on Electromagnetic Compatibility, 2007.
B. Deutschmann, F. Magrini, Y. Cao, "Robustness of ESD protection structures against automotive transient disturbances", IEEE Asia-Pacific International Symposium on Electromagnetic Compatibility, 2010.
G. Masetti, G. Setti and N. Speciale, "On the key Role of parasitic Capacitances in the Determination of Susceptibility to EMI of Integrated Operational Amplifiers", EMC Zurich, 1999.
IEC 62132, Integrated Circuits, Measurements of Electromagnetic Immunity up to 1 GHz, available online: www.iec.ch.
P. Schroter, F. Klotz, "On chip filtering versus layout techniques to reduce RF coupled disturbances", IEEE International Symposium on Electromagnetic Compatibility, 2010.
A. Richelli, L. Colalongo and Zs. M. Kovacs-Vajna, "Increasing the Immunity to Electromagnetic Interferences of CMOS Operational Amplifiers," IEEE Transactions on Reliability, vol. 52, no. 3, pp. 349-353, 2003.
A. Richelli, L. Colalongo, M. Quarantelli and Zs. M. Kovacs-Vajna, "Robust design of low EMI susceptibility CMOS opamp," IEEE Transactions on Electromagnetic Compatibility, vol. 46, no. 2, pp. 291-298, 2004.
A. Richelli, "CMOS opamp Resisting to Large Electromagnetic Interferences," IEEE Transactions on Electromagnetic Compatibility, vol. 52, no. 4, pp. 1062-1065, 2010.
A. Richelli, "Increasing EMI Immunity in novel low-voltage CMOS opamps," IEEE Transactions on Electromagnetic Compatibility, vol. 54, no. 4, pp. 947-950, 2012.
A. Boni, "Op-Amps and Startup Circuits for CMOS Bandgap References With Near 1-V Supply," IEEE Journal of Solid State Circuits, vol. 37, no. 10, pp. 1339-1343, 2002.
S. Sbaraini, A. Richelli and Zs. M. Kovacs-Vajna, "EMI susceptibility in bulkdriven Miller opamp," IET Electronics Letters, vol. 46, no. 16, pp. 1111-1113, 2010.
A. Richelli, "Design considerations for an ultra-low voltage amplifier with high EMI immunity", ICECS, pp. 558-561, Malta, 2008.
A. Richelli, "Measurements of EMI susceptibility in ultra-low-voltage opamps", International Symposium on Electromagnetic Compatibility (EMC COMPO), pp. 13-17, Croatia, 2011.