Susceptibility of Operational Amplifiers to Conducted EMI Injected Through the Ground Plane into Their Output Terminal

CMOS; Buffer amplifiers; Electromagnetic pulse; Electromagnetic wave interference; Mixed signal integrated circuits; Printed circuit boards; Printed circuits; Signal interference; Commercial Devices; Conducted EMI; Ground planes; IC pins; Printed circuit board designs; Voltage buffer; Operational amplifiers

Abstract :

[en] In practical printed circuit board (PCB) designs, electromagnetic interference (EMI) is coupled from the ground plane, which is commonly shared among the analog, digital, and mixed-signal integrated circuits. This noisy ground plane couples interference capacitively to all the IC pins, including the output: this effect is exacerbated when the IC is connected to long wires and traces that are routed close to the conductive ground plane. This paper reports on the effect of interference, which is coupled capacitively from the PCB ground plane into all the IC pins of an opamp connected as a voltage buffer. Simulations illustrate the susceptibilities in custom operational amplifier designs, and are corroborated by measurements on several commercial devices. These measurements show that the EMI-induced offset can attain considerable values for the most critical EMI frequencies, which lie between 10 and 100 MHz. Moreover, these illustrate that there is a considerable susceptibility of operational amplifiers to electromagnetic interference coupled to their output pins. © 2016 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Richelli, A.; Department of Information Engineering, University of Brescia, Brescia, 25121, Italy

Delaini, G.; Department of Information Engineering, University of Brescia, Brescia, 25121, Italy

Grassi, M.; Department of Information Engineering, University of Brescia, Brescia, 25121, Italy

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Language :

English

Title :

Susceptibility of Operational Amplifiers to Conducted EMI Injected Through the Ground Plane into Their Output Terminal

Publication date :

2016

Journal title :

IEEE Transactions on Reliability

eISSN :

0018-9529

Publisher :

Institute of Electrical and Electronics Engineers Inc.

Volume :

Issue :

Pages :

1369-1379

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 14 September 2018

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