Article (Scientific journals)
An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC 180 nm CMOS
Richelli, A.; Kennedy, S.; Redouté, Jean-Michel
2017In IEEE Transactions on Electromagnetic Compatibility, 59 (6), p. 2049-2051
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Keywords :
Analog circuits; CMOS integrated circuits; Electromagnetic pulse; Operational amplifiers; CMOS operational amplifiers; CMOS processs; Common mode; Input stages; On chips; Test chips; Differential amplifiers
Abstract :
[en] This letter presents an on-chip common-mode cancelation circuit (CMCC), which increases the immunity to electromagnetic interference (EMI) of the input stage in a classic CMOS operational amplifier. Two test chips, containing a classic Miller amplifier and a Miller amplifier with CMCC, respectively, have been fabricated in the UMC 180 nm CMOS process. Measurements illustrate how the latter amplifier exhibits an increased immunity to EMI compared with the former. © 2017 IEEE.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Richelli, A.;  Department of Electronic Automation, University of Brescia, Brescia, 25123, Italy
Kennedy, S.;  Department of Electrical and Computer Systems Engineering, Monash University, Clayton, VIC 3800, Australia
Redouté, Jean-Michel  ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés
Language :
English
Title :
An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC 180 nm CMOS
Publication date :
2017
Journal title :
IEEE Transactions on Electromagnetic Compatibility
ISSN :
0018-9375
eISSN :
1558-187X
Publisher :
Institute of Electrical and Electronics Engineers Inc.
Volume :
59
Issue :
6
Pages :
2049-2051
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 11 September 2018

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