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An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC 180 nm CMOS

Richelli, A.; Kennedy, S.; Redouté, Jean-Michel

2017 • In IEEE Transactions on Electromagnetic Compatibility, 59 (6), p. 2049-2051

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2017 - An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC.pdf

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