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On the characterization of frequency-persistent scatterers in Split-Band Interferometry
Libert, Ludivine; De Rauw, Dominique; d'Oreye, Nicolas et al.
2018In IGARSS 2018: 2018 IEEE International Geoscience & Remote Sensing Symposium : proceedings : July 22-27, 2018, Valencia, Spain
Peer reviewed
 

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Keywords :
SAR; Interferometry; Multichromatic Analysis; Frequency-persistent scatterers; Split-band; Spectral coherence
Abstract :
[en] Split-Band Interferometry (SBInSAR) requires the presence of reliable frequency-persistent scatterers within the studied scene. However, the physical nature of such reflectors is still poorly known. In this work, we perform a temporal analysis over the region of the Virunga Volcanic Province (Democratic Republic of Congo - DRC) and we show that frequency-persistent scatterers are not necessarily stable over time. We study and quantify the effect of the range resolution loss due to the bandwidth degradation in the SBInSAR process. Finally, radiometric information and spectral coherence are used to show that frequency-persistent scatterers cannot be associated to a specific scattering mechanism.
Research center :
CSL - Centre Spatial de Liège - ULiège
Disciplines :
Physics
Author, co-author :
Libert, Ludivine ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
De Rauw, Dominique  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
d'Oreye, Nicolas
Orban, Anne ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Barbier, Christian ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Language :
English
Title :
On the characterization of frequency-persistent scatterers in Split-Band Interferometry
Publication date :
24 July 2018
Event name :
2018 IEEE International Geoscience and Remote Sensing Symposium
Event organizer :
IEEE
Event place :
Valencia, Spain
Event date :
22-27 July 2008
Audience :
International
Main work title :
IGARSS 2018: 2018 IEEE International Geoscience & Remote Sensing Symposium : proceedings : July 22-27, 2018, Valencia, Spain
Publisher :
Institute of Electrical and Electronics Engineers, Piscataway, United States - New Jersey
ISBN/EAN :
978-1-5386-7150-4
Pages :
1332-1335
Peer reviewed :
Peer reviewed
Name of the research project :
MUZUBI - RESIST
Funders :
BELSPO - SPP Politique scientifique - Service Public Fédéral de Programmation Politique scientifique
Available on ORBi :
since 23 August 2018

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