Evaluation of Tribo-Mechanical Properties of Thin Films Using Atomic Force Microscope

Experimental investigations of mechanical and tribological properties of thin films using an atomic force microscope and its combination with nanoidentation are presented in this paper. The normal mode of an atomic force microscope is used to measure the stiffness and hardness of thin films which are tribologically characterized by roughness, nano-scale adhesion forces and friction forces. The friction forces are measured using the lateral force mode of atomic force microscope. In order to measure the adhesion forces of thin films, spectroscopy in point with atomic force microscope was performed. Direct measurement of tribological and mechanical behaviour of thin films is important to increase the lifetime of microstructures which use thin films for friction and stiction reduction of microsystems.