XPS data analysis via Wavelets and Fourier Transform.

Charles, Catherine; Rasson, Jean-Paul

doi:10.1002/sia.1650

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Article (Scientific journals)

XPS data analysis via Wavelets and Fourier Transform.

Charles, Catherine; Rasson, Jean-Paul; Leclerc, Gervais

2004 • In Surface and Interface Analysis, 36, p. 71-80

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https://hdl.handle.net/2268/21697

DOI
10.1002/sia.1650

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Disciplines :

Physics

Author, co-author :

Charles, Catherine ; Université de Liège - ULiège > Gembloux Agro-Bio Tech > Gembloux Agro-Bio Tech

Rasson, Jean-Paul; Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > Mathématiques > Statistiques

Other collaborator :

Leclerc, Gervais; Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > Physique

Language :

English

Title :

XPS data analysis via Wavelets and Fourier Transform.

Publication date :

2004

Journal title :

Surface and Interface Analysis

ISSN :

0142-2421

eISSN :

1096-9918

Publisher :

John Wiley & Sons, Hoboken, United States - New Jersey

Volume :

Pages :

71-80

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 10 September 2009

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Bibliography

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Kover L. Surf. Interface Anal. 2000; 29: 671.
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Donoho DL, Johnstone IM. Biometrika 1994; 81: 425.
Donoho DL, Johnstone IM, Kerkyacharian G, Picard D. J. R. Stat. Soc. Ser. B 1995; 57: 301.
Donoho DL, Johnstone IM, Kerkyacharian G, Picard D. C. R. Acad. Sci. Paris (A) 1992; 315: 211.
Kolaczyk ED. Biometrika 1996; 46: 352.
Charles C, Rasson J-P. Computational Statistics and Data Analysis 2003; 43: 139.
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Conny JM, Powell CJ, Currie LA. Surf. Interface Anal. 1998; 26: 939.
Conny JM, Powell CJ. Surf. Interface Anal. 2000; 29: 444.