2005 • In Smith, L. M.; Pourboghrat, F.; Yoon, J. W.et al. (Eds.) On the Cutting Edge of Technology NUMISHEET 2005, Proceedings of the 6th International Conference and Workshop on Numerical Simulation of 3D Sheet Metal Forming Processes
[en] The bi-axial experimental equipment [1] developed by Flores enables to perform Baushinger shear tests and successive or simultaneous simple shear tests and plane-strain tests. Such experiments and classical tensile tests investigate the material behavior in order to identify the yield locus and the hardening models. With tests performed on two steel grades, the methods applied to identify classical yield surfaces such as Hill or Hosford ones as well as isotropic
Swift type hardening or kinematic Armstrong–Frederick hardening models are explained. Comparison with the Taylor-Bishop-Hill yield locus is also provided. The effect of both yield locus and hardening model choice will be presented for two applications: Single Point Incremental Forming (SPIF) and a cup deep drawing.
Disciplines :
Civil engineering
Author, co-author :
Flores, Paulo
Duchene, Laurent ; Université de Liège - ULiège > Département Argenco : Secteur MS2F > Département Argenco : Secteur MS2F
Lelotte, Thomas
Bouffioux, Chantal ; Université de Liège - ULiège > Département Argenco : Secteur MS2F > Département Argenco : Secteur MS2F
El Houdaigui, F.
Van Bael, A.
He, S.
Habraken, Anne ; Université de Liège - ULiège > Département ArGEnCo > Département ArGEnCo
Language :
English
Title :
Model identification and FE simulations: effect of different yield loci and hardening laws in sheet forming
Publication date :
2005
Event name :
6th international conference and workshop on numerical simulation of 3D sheet metal forming processes (NUMISHEET)
Event place :
Detroit, United States
Event date :
du 15 au 19 août 2005
Audience :
International
Main work title :
On the Cutting Edge of Technology NUMISHEET 2005, Proceedings of the 6th International Conference and Workshop on Numerical Simulation of 3D Sheet Metal Forming Processes
Editor :
Smith, L. M.
Pourboghrat, F.
Yoon, J. W.
Stoughton, T. B.
Publisher :
American Institute of Physics (AIP), Melville (New York), United States
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