[en] We report on the integration of small-scale optical components into silicon wafers for use in atom chips. We present an on-chip fibre-optic atom detection scheme that can probe clouds with small atom numbers. The fibres can also be used to generate microscopic dipole traps. We describe our most
recent results with optical microcavities and show that a sufficiently high finesse can be achieved to enable single-atom detection on an atom chip. The key components have been fabricated by etching directly into the atom chip silicon substrate.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Eriksson, S.
Trupke, Michael
Powell, H. F.
Sahagun, D.
Sinclair, D. J.
Curtis, E. A.
Sauer, B. E.
Hinds, Edward A.
Moktadir, Zakaria
Gollasch, Carsten O.
Kraft, Michaël ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés
Language :
English
Title :
Integrated optical components on atom chips
Publication date :
2005
Journal title :
European Physical Journal D. Atoms, Molecules, Clusters and Optical Physics
