Reference : Wavelets Characterization of coarsing during unstable MBE growth
Scientific congresses and symposiums : Paper published in a book
Engineering, computing & technology : Electrical & electronics engineering
http://hdl.handle.net/2268/183428
Wavelets Characterization of coarsing during unstable MBE growth
English
Moktadir, Z []
Kraft, Michael mailto [Université de Liège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés >]
Dec-2004
Proceedings of "Low Dimensional Semiconductor Devices Conference, Cancun, décembre 2004"
Yes
International
Low Dimensional Semiconductor Devices Conference
Décembre 2004
Cancun
Mexico
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/183428

There is no file associated with this reference.

Bookmark and Share SFX Query

All documents in ORBi are protected by a user license.