Electrical modelling of interface traps in GeSn MOS structures

Unpublished conference/Abstract (Scientific congresses and symposiums)

Baert, Bruno; Cerica, Delphine; Schmeits, Marcel et al.

2014 • JSPS International Core-to-Core Program Workshop on Atomically Controlled Processing for Ultra-large Scale Integration

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https://hdl.handle.net/2268/174386

B_Baert_jsps2014_submitted.pdf

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Keywords :

GeSn; MOS; numerical simulation; interface; traps; modelling

Disciplines :

Physics

Author, co-author :

Baert, Bruno ; Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures

Cerica, Delphine ; Université de Liège - ULiège > Département de Physique > Physique des solides, interfaces et nanostructures

Schmeits, Marcel ; Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures

Nguyen, Ngoc Duy ; Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures

Language :

English

Title :

Electrical modelling of interface traps in GeSn MOS structures

Publication date :

13 November 2014

Event name :

JSPS International Core-to-Core Program Workshop on Atomically Controlled Processing for Ultra-large Scale Integration

Event place :

Leuven, Belgium

Event date :

du 13 au 14 novembre 2014

By request :

Yes

Audience :

International

Available on ORBi :

since 25 November 2014

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195 (52 by ULiège)

Number of downloads

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