Electrical characterization of pGeSn/nGe diodes

I-V characteristics of pGeSn/nGe diodes have been measured and show very good properties.
Simulations of the same structure are able to reproduce most of the observed behavior and point to the predominating influence of parameters such as the band gap energy of the GeSn layer. C-V characteristics showing little frequency dependence have also been measured, and their analysis for the determination of the carrier concentration is confirmed by simulations. More investigations, including the effect of temperature and other defects at the interface or in the bulk of either layers are still required in order to explain some of the observed behaviors, notably the reverse saturation current.