Fruit microstructure evaluation using synchrotron X-ray computed tomography

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Unpublished conference/Abstract (Scientific congresses and symposiums)

Verboven, Pieter; Kerckhofs, Greet; Mebatsion, Hibru K. et al.

2008 • Tenth International Congress on Engineering and Food 2008

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https://hdl.handle.net/2268/161716

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Disciplines :

Engineering, computing & technology: Multidisciplinary, general & others

Author, co-author :

Verboven, Pieter

Kerckhofs, Greet ; Université de Liège - ULiège > Département d'aérospatiale et mécanique > Génie biomécanique

Mebatsion, Hibru K.

Wevers, Martine

Cloetens, Peter

Nicolaï, Bart

Language :

English

Title :

Fruit microstructure evaluation using synchrotron X-ray computed tomography

Publication date :

2008

Event name :

Tenth International Congress on Engineering and Food 2008

Event date :

20-24 April, 2008

Audience :

International

Available on ORBi :

since 21 January 2014

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