Electrical Activity of Threading Dislocations and Defect Complexes in GeSn Epitaxial Layers

Gupta, Somya; Simoen, Eddy; Asano, Takanori; Nakatsuka, Osamu; Gencarelli, Federica; Shimura, Yosuke; Moussa, Alain; Loo, Roger; Zaima, Shigeaki; Baert, Bruno; Dobri, Adam; Nguyen, Ngoc Duy; Heyns, Marc

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Electrical Activity of Threading Dislocations and Defect Complexes in GeSn Epitaxial Layers

Gupta, Somya; Simoen, Eddy; Asano, Takanori et al.

2013 • The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8)

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https://hdl.handle.net/2268/146619

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Disciplines :

Physics

Author, co-author :

Gupta, Somya; Katholieke Universiteit Leuven - KUL

Simoen, Eddy; IMEC

Asano, Takanori; Nagoya University

Nakatsuka, Osamu; Nagoya University

Gencarelli, Federica; IMEC

Shimura, Yosuke; IMEC

Moussa, Alain; IMEC

Loo, Roger; IMEC

Zaima, Shigeaki; Nagoya University

Baert, Bruno ; Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures

More authors (3 more)

Language :

English

Title :

Electrical Activity of Threading Dislocations and Defect Complexes in GeSn Epitaxial Layers

Publication date :

04 June 2013

Event name :

The 8th International Conference on Silicon Epitaxy and Heterostructures (ICSI-8)

Event place :

Fukuoka, Japan

Event date :

2-7 juin 2013

Audience :

International

Available on ORBi :

since 10 April 2013

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