Article (Scientific journals)
Impedance Spectroscopy of GeSn-based Heterostructures
Baert, Bruno; Nakatsuka, Osamu; Zaima, Shigeaki et al.
2013In ECS Transactions, 50 (9), p. 481-490
Peer reviewed
 

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Keywords :
GeSn; Admittance spectroscopy; Electrical characterization; Heterostructures; Semiconductors
Abstract :
[en] In this work, we investigated the electrical characteristics of p-GeSn/p-Ge and p-GeSn/n-Ge structures obtained by simulation of the basic semiconductor equations. We developed a numerical formalism based on a drift-diffusion model including a trap level and applied it to typical GeSn-based heterostructures by focusing on the electrical response under small-signal alternating current regime. The results demonstrate that our method provides an access to both microscopic and macroscopic properties, and thereon, to a physical interpretation of the electrical characteristics of GeSn-based structures by linking measurable quantities to micro-scale variations in the structures.
Disciplines :
Physics
Author, co-author :
Baert, Bruno ;  Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures
Nakatsuka, Osamu;  Nagoya University, Graduate School of Engineering > Department of Crystalline Materials Science
Zaima, Shigeaki;  Nagoya University, Graduate School of Engineering > Department of Crystalline Materials Science
Nguyen, Ngoc Duy  ;  Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures
Language :
English
Title :
Impedance Spectroscopy of GeSn-based Heterostructures
Publication date :
2013
Journal title :
ECS Transactions
ISSN :
1938-5862
eISSN :
1938-6737
Publisher :
The Electrochemical Society, Pennington, United States - New Jersey
Volume :
50
Issue :
9
Pages :
481-490
Peer reviewed :
Peer reviewed
Available on ORBi :
since 09 July 2012

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