Article (Scientific journals)
Nanomechanical and nanotribological characterization of microelectromechanical system
Pustan, Marius; Muller, Raluca; Golinval, Jean-Claude
2012In Journal of Optoelectronics and Advanced Materials, 14 (3-4), p. 401-412
Peer reviewed
 

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Keywords :
Flexible microcomponents; Stiffness; Frequency response; Quality factor; Friction and stiction
Abstract :
[en] Investigations of the mechanical and tribological properties of microelectromechanical system (MEMS) components on nanoscale can provide insights into failure mechanism of material. The main goal of this paper is focused on the mechanical and tribological characterizations of MEMS mechanical components in order to improve their reliability design. The mechanical properties of interests are stiffness, modulus of elasticity, stress, strain. Dynamical investigations are performed to analyze the resonant frequency response, velocity and amplitude of oscillations of electrostatically actuated microcomponents and to estimate the quality factor. Finite element analysis is used to validate the experimental results of mechanical properties and to simulate the dynamical behaviour of investigated microcomponents. Tribological investigations are developed to estimate the stiction and friction. Testing and the individual characterization of MEMS materials and structures, performed using advanced equipments such as atomic force microscope and optical vibrometer analyzer are presented.
Disciplines :
Materials science & engineering
Mechanical engineering
Author, co-author :
Pustan, Marius;  Technical University of Cluj-Napoca > Department of Machine Elements and Tribology
Muller, Raluca;  National Institute for R&D in Microtechnologies (IMT-Bucharest)
Golinval, Jean-Claude  ;  Université de Liège - ULiège > Département d'aérospatiale et mécanique > LTAS - Vibrations et identification des structures
Language :
English
Title :
Nanomechanical and nanotribological characterization of microelectromechanical system
Publication date :
2012
Journal title :
Journal of Optoelectronics and Advanced Materials
ISSN :
1454-4164
eISSN :
1841-7132
Publisher :
INOE, Bucharest, Romania
Volume :
14
Issue :
3-4
Pages :
401-412
Peer reviewed :
Peer reviewed
Name of the research project :
FIRST Post-Doc n°616365 (MOMIVAL)
Funders :
DGTRE - Région wallonne. Direction générale des Technologies, de la Recherche et de l'Énergie [BE]
Romanian National Authority for Scientific Research, CNCS-UEFISCDI
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