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Influence of contact resistance on shielding efficiency of shielding gutters for HV cables
Koroglu, Selim; Sergeant, Peter; V Sabariego, Ruth et al.
2010In Proceedings of the 14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
Peer reviewed
 

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Abstract :
[en] Shielding of buried three phase high voltage cables can be done by placing the cables in conducting ferromagnetic U-shaped gutters covered by plates. In case of a perfect electrical contact between adjacent gutters and between adjacent cover plates, the induced currents in the shield efficiently reduce the field generated in the vicinity of the cables. However, as a perfect contact cannot be guaranteed, it is useful to quantify the effect of a bad electrical contact on the shielding performance. From 2D FEM, 3D FEM and experiments, it is observed that a bad contact does not influence significantly the shielding if the axial length of the plates is relatively long compared to their other dimensions.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Koroglu, Selim;  Yildiz Tech. Univ., Besiktas-Istanbul, Turkey
Sergeant, Peter;  Universiteit Gent - Ugent
V Sabariego, Ruth ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE)
Dang, Quoc Vuong ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Applied and Computational Electromagnetics (ACE)
De Wulf, M.;  ArcelorMittal Global R&D Gent, B-9060 Zelzate, Belgium
Language :
English
Title :
Influence of contact resistance on shielding efficiency of shielding gutters for HV cables
Publication date :
2010
Event name :
14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
Event organizer :
IEEE
Event place :
Chicago, Illinois, United States
Event date :
May 9-12, 2010
Audience :
International
Main work title :
Proceedings of the 14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC2010)
Publisher :
IEEE
ISBN/EAN :
978-1-4244-7059-4
Peer reviewed :
Peer reviewed
Available on ORBi :
since 31 January 2011

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