Infrared Electronic speckle pattern interferometry at 10 µm

Demonstration of electronic speckle pattern interferometry of opaque scattering objects at 10 µm wavelength using a commercial thermal-camera is presented for the first time to our knowledge. The idea of using a wavelength longer than the usual visible ones is to render such holographic displacement measurement techniques less sensitive to external perturbations. We have observed the rotation of a metallic plate and applied the phase-shifting technique for quantitative measurements