In-plane and out-of-plane holographic interferometry with multibeam photorefractive recordings in sillenite photorefractive crystals

In this paper we present results of the multiple beams recording in photorefractive crystals for multidirectional measurement of object displacement by holographic interferometry. Taking advantage of the possibility to record several holograms in the photorefractive crystal without noticeable cross-talk and loss of signal-to-noise ratio, we demonstrate the applicability of this technique to high resolution metrology and nondestructive testing. A first part of the paper is devoted to metrological certification of the process. On the basis of known "in-plane" and "out-of plane" movements, we certify the measurement deconvolution algorithm and error. A second part will concern the measurement of thermo-mechanical composite material properties (Poisson coefficient, ...) with a compact transportable head using double recording illumination